Atommagkutató Intézet

APHA Szerző - Gruzza B.⁴

**P15353**
*Application for the excitation of medium energy (up to 10keV) photoelectron and Auger lines used in the study of surface analytical applications.*
Szerzők	Tóth J., Molnár Gy., Varga D., Cserny I., Kövér L., Kiss J., Gál I., Nagy A., Domonyi A., Kertész Zs., Mosolygó J., Tarr G., Petô G., Szabó I., Ould-Metidji Y., Gruzza B., Bideux L., Matolin V., Sulyok A., Menyhárd M.
Megjelenés helye	Atomki Annual Report 2001 0 (2002) 58
Jelleg	Annual Report
Témák	Developm. of Instr. and Methods

**P15262**
*Ag, Ge and Sn reference samples for elastic peak electron spectroscopy (EPES), used for experimental determination of the inelastic mean free path and the surface excitation parameter.*
Szerzők	Gurban S., Gergely G., Menyhárd M., Adam J., Adamik M., Daróczi Cs., Tóth J., Varga D., Csik A., Gruzza B.
Megjelenés helye	^SCI Surface and Interface Analysis 34 (2002) 206
Impakt faktor	1.071²⁰⁰²
Jelleg	Scientific paper, proceedings
Témák	Developm. of Instr. and Methods Materials Science and Analytics
Linkek	DOI Hivatkozások (13)

**P14663**
*Determination of inelastic mean free paths for AuPd alloys by elastic peak electron spectroscopy (EPES).*
Szerzők	Krawczyk M., Jablonski A., Zommer L., Tóth J., Varga D., Kövér L., Gergely L., Menyhárd M., Sulyok A., Benedek Zs., Gruzza B., Robert C.
Megjelenés helye	^SCI Surface and Interface Analysis 33 (2002) 23
Impakt faktor	1.071²⁰⁰²
Jelleg	Scientific paper, proceedings
Témák	Materials Science and Analytics
Linkek	DOI Hivatkozások (11)

**P14381**
A special XPS-XAES X-ray source and its application for the excitation of medium energy (up to 10 keV) photoelectron and Auger lines used in the study of surface analytical applications (TU-P-TDE 07. Book of abstr.: p. 293).
Szerzők	Tóth J., Molnár Gy., Varga D., Cserny I., Kövér L., Kiss J., Gál I., Nagy A., Domonyi A., Kertész Zs., Mosolygó J., Tarr G., Petô G., Szabó I., Ould-Metidji Y., Gruzza B., Bideux L., Matolin V., Sulyok A., Menyhárd M.
Megjelenés helye	ECASIA-2001. 9th European Conference on Applications of Surface and Interface Analysis. Avignon, France, 30 Sept. - 5 Oct., 2001 0 (2001) 0
Jelleg	Conf. abstract, poster, talk
Témák	Developm. of Instr. and Methods Materials Science and Analytics

**P14380**
Ag, Ge and Sn reference samples for elastic peak electron spectroscopy (EPES), used for experimental determination of the IMFP and surface excitation parameter (SEP) (MO-O-DIQ 10. Book of abstr.: p. 48).
Szerzők	Gurban S., Gergely G., Menyhárd M., Adam J., Zsolt G., Adamik M., Daróczi Cs., Tóth J., Varga D., Jablonski A., Gruzza B.
Megjelenés helye	ECASIA-2001. 9th European Conference on Applications of Surface and Interface Analysis. Avignon, France, 30 Sept. - 5 Oct., 2001 0 (2001) 0
Jelleg	Conf. abstract, poster, talk
Témák	Developm. of Instr. and Methods Materials Science and Analytics

**P13960**
*UHV aluminium oxide on silicon substrates: electron spectroscopies analysis and electrical measurements.*
Szerzők	Gruzza B., Merle S., Bideux L., Robert C., Kövér L., Tóth J., Matolin V.
Megjelenés helye	^SCI Applied Surface Science 175 (2001) 656
Impakt faktor	1.068²⁰⁰¹
Jelleg	Scientific paper, proceedings
Témák	Materials Science and Analytics
Linkek	DOI Hivatkozások (1)

**P13565**
*UHV aluminium oxide on silicon substrates: Electron spectroscopic analysis and electric measurements. (Program and abstracts: p. WE-A0930).*
Szerzők	Gruzza B., Merle S., Bideux L., Robert C., Kövér L., Tóth J., Matolin V.
Megjelenés helye	10th International Conference on Solid Films and Surfaces - ICSF-10. Princeton, USA, July 9-13, 2000 0 (2000) 0
Jelleg	Conf. abstract, poster, talk
Témák	Materials Science and Analytics

**P13378**
*Determination of yield ratios of elastically backscattered electrons for deriving inelastic mean free paths in solids.*
Szerzők	Varga D., Kövér L., Tóth J., Tôkési K., Lesiak B., Jablonski A., Robert C., Gruzza B., Bideux L.
Megjelenés helye	^SCI Surface and Interface Analysis 30 (2000) 202
Impakt faktor	1.215²⁰⁰⁰
Jelleg	Scientific paper, proceedings
Témák	Developm. of Instr. and Methods Atomic and Molecular Physics Materials Science and Analytics
Linkek	DOI Hivatkozások (1)

**P12582**
*Determination of yield ratios of elastically backscattered electrons for deriving inelastic mean free path in solids (ECASIA'99 Abstracts, MO-QA29 p.204).*
Szerzők	Varga D., Kövér L., Tóth J., Tôkési K., Lesiak B., Jablonski A., Robert C., Gruzza B., Bideux L.
Megjelenés helye	8th European Conference on Applied Surface and Interface Analysis. Sevilla, Spain, 4-8 Oct., 1999 0 (1999) 0
Jelleg	Conf. abstract, poster, talk
Témák	Developm. of Instr. and Methods Atomic and Molecular Physics Materials Science and Analytics

**P12579**
*Experimental determination of the inelastic mean free path of electrons in GaSb and InSb.*
Szerzők	Gergely G., Sulyok A., Menyhárd M., Tóth J., Varga D., Jablonski A., Krawczyk M., Gruzza B., Bideux L., Robert C.
Megjelenés helye	^SCI Applied Surface Science 144 (1999) 173
Impakt faktor	1.195¹⁹⁹⁹
Jelleg	Scientific paper, proceedings
Témák	Developm. of Instr. and Methods Materials Science and Analytics
Linkek	DOI Hivatkozások (2)

	Total	Headed by ATOMKI under name of the author	Part of the author	Part of the author & ATOMKI
Publications:	20	0	0.887	0
^SCIPublications:	7	0	0.297	0
Cited publications:	7	0	0.297	0
Non-locally cited publications:	6	0	0.269	0
Cited ^SCIpublications:	7	0	0.297	0
Non-locally cited ^SCIpublications:	6	0	0.269	0
^SCICited publications:	5	0	0.214	0
Non-locally ^SCIcited publications:	5	0	0.214	0
^SCICited ^SCIpublications:	5	0	0.214	0
Non-locally ^SCIcited ^SCIpublications:	5	0	0.214	0
Citations:	32	0	1.088	0
Non-local citations:	31	0	1.06	0
SCICitations:	32	0	1.088	0
Non-local ^SCIcitations:	22	0	0.76	0
Impact^~2002:	6.604	0	0.887	0
Averaged impact:	0.33	0	0.887	0
^SCIaveraged impact:	0.943	0	0.297	0
Citational effectivity:	4.571	0	0.297	0
Non-local citational effectivity:	5.167	0	0.269	0
SCIcitational effectivity:	4.4	0	0.214	0
Non-local ^SCIcitational effectivity:	4.4	0	0.214	0
Publications, n:	9.1	0	0	0
^SCIPublications, n:	8.286	0	0	0
Cited publications, n:	8.286	0	0	0
Non-locally cited publications, n:	8.333	0	0	0
Cited ^SCIpublications, n:	8.286	0	0	0
Non-locally cited ^SCIpublications, n:	8.333	0	0	0
^SCICited publications, n:	8.4	0	0	0
Non-locally ^SCIcited publications, n:	8.4	0	0	0
^SCICited ^SCIpublications, n:	8.4	0	0	0
Non-locally ^SCIcited ^SCIpublications, n:	8.4	0	0	0
z-index:	2	0	0	0