Atommagkutató Intézet

APHA Szerző - Tougaard S.⁴

Publikációk
Hivatkozások

**P25609**
*Comparison between surface excitation parameter obtained from QUEELS and SESINIPAC.*
Szerzők	Pauly N., Novák M., Dubus A., Tougaard S.
Megjelenés helye	Surface and Interface Analysis 44 (2012) 1147
Impakt faktor	1.220²⁰¹²
Jelleg	Scientific paper, proceedings
Témák	Materials Science and Analytics
Linkek	Hivatkozások (2)

**P19387**
*Intrinsic and extrinsic excitations in deep core photoelectron spectra of solid Ge.*
Szerzők	Kövér L., Novák M., Egri S., Cserny I., Berényi Z. J., Tóth J., Varga D., Drube W., Yubero F., Tougaard S., Werner W. S. M.
Megjelenés helye	^SCI Surface and Interface Analysis 38 (2006) 569
Impakt faktor	1.427²⁰⁰⁶
Jelleg	Scientific paper, proceedings
Témák	Atomic and Molecular Physics Materials Science and Analytics
Linkek	DOI Hivatkozások (4)

**P18922**
*Test of dielectric-response model for energy and angular dependence of plasmon excitations in core-level photoemission.*
Szerzők	Yubero F., Kövér L., Drube W., Eickhoff T., Tougaard S.
Megjelenés helye	^SCI Surface Science 592 (2005) 1
Impakt faktor	1.780²⁰⁰⁵
Jelleg	Scientific paper, proceedings
Témák	Developm. of Instr. and Methods Atomic and Molecular Physics Materials Science and Analytics
Linkek	DOI Hivatkozások (3)

**P18768**
*Intrinsic and extrinsic losses in deep core photoelectron and Auger spectra of solid Ge and Si (Book of Abstracts of ECASIA 05, p. 226).*
Szerzők	Kövér L., Novák M., Egri S., Cserny I., Berényi Z. J., Tóth J., Végh J., Varga D., Drube W., Yubero F., Tougaard S., Werner W. S. M.
Megjelenés helye	11th European Conference on Applications of Surface and Interface Analysis. ECASIA 05. Vienna, Austria, 25-30 Sept., 2005 0 (2005) 0
Jelleg	Conf. abstract, poster, talk
Témák	Atomic and Molecular Physics Materials Science and Analytics

**P18765**
*Test of dielectric response model for energy and angular dependence of plasmon excitations in core-level photoemission (Book of abstracts of ECASIA 05, p. 225).*
Szerzők	Yubero F., Tougaard S., Kövér L., Drube W., Eickhoff T.
Megjelenés helye	11th European Conference on Applications of Surface and Interface Analysis. ECASIA 05. Vienna, Austria, 25-30 Sept., 2005 0 (2005) 0
Jelleg	Conf. abstract, poster, talk
Témák	Developm. of Instr. and Methods Materials Science and Analytics

**P17476**
*Contribution of intrinsic and extrinsic excitations to KLL Auger spectra induced from Ge films.*
Szerzők	Berényi Z. J., Kövér L., Tougaard S., Yubero F., Tóth J., Cserny I., Varga D.
Megjelenés helye	^SCI Journal of Electron Spectroscopy and Related Phenomena 135 (2004) 177
Impakt faktor	1.069²⁰⁰⁴
Jelleg	Scientific paper, proceedings
Témák	Atomic and Molecular Physics
Linkek	DOI Hivatkozások (3)

**P17108**
*Extrinsic and intrinsic excitations in Ge and Si photoelectron spectra (Abstracts of AVS50, http://www.avs.org).*
Szerzők	Kövér L., Berényi Z. J., Tougaard S., Yubero F., Cserny I., Végh J., Tóth J., Varga D., Drube W., Eickhoff T.
Megjelenés helye	50th International Symposium of the American Vacuum Society. Baltimore, USA, 2-7 Nov., 2003 0 (2003) 0
Jelleg	Conf. abstract, poster, talk
Témák	Developm. of Instr. and Methods Materials Science and Analytics

**P16988**
*Thickness of thin Co films determined by K-Auger spectral shapes analysis and RBS (Book of abstracts: p. 371).*
Szerzők	Kövér L., Tougaard S., Simon A., Tóth J., Egri S., Berényi Z. J., Jeynes C.
Megjelenés helye	10th European Conference on Applications of Surface and Interface Analysis. ECASIA 03. Berlin, Germany, 5-10 Oct., 2003 0 (2003) 0
Jelleg	Conf. abstract, poster, talk
Témák	Developm. of Instr. and Methods Materials Science and Analytics

**P16718**
*Contribution of intrinsic and extrinsic excitations to KLL Auger spectra induced from Ge films (Abstr.: p. 149).*
Szerzők	Berényi Z. J., Kövér L., Tougaard S., Yubero F., Tóth J., Varga D.
Megjelenés helye	9th International Conference on Electronic Spectroscopy and Structure. ICESS-9. Uppsala, Sweden, June 30 - July 4, 2003 0 (2003) 0
Jelleg	Conf. abstract, poster, talk
Témák	Atomic and Molecular Physics Materials Science and Analytics

**P16698**
*Experimental determination of electron inelastic scattering cross-sections in Si, Ge and III-V semiconductors.*
Szerzők	Orosz G. T., Gergely G., Gurban S., Menyhárd M., Tóth J., Varga D., Tougaard S.
Megjelenés helye	^SCI Vacuum 71 (2003) 147
Impakt faktor	0.612²⁰⁰³
Jelleg	Scientific paper, proceedings
Témák	Materials Science and Analytics
Linkek	DOI

Összes Publikációja

**H14237** --> **P7684**
Megjelenés helye	^SCI Journal of Vacuum Science and Technology A
Megjelenés éve	1996
Oldal	1415
Kötet	14
Hivatkozó	Tougaard S.
Linkek	Hivatkozott Publikáció

**H23763** --> **P7684**
Megjelenés helye	^SCI Surface and Interface Analysis
Megjelenés éve	1998
Oldal	249
Kötet	26
Hivatkozó	Tougaard S.
Linkek	Hivatkozott Publikáció

**H33901** --> **P19387**
Megjelenés helye	^SCI Journal of Electron Spectroscopy and Related Phenomena
Megjelenés éve	2010
Oldal	128
Kötet	178
Hivatkozó	Tougaard S.
Linkek	Hivatkozott Publikáció

**H41634** --> **P7684**
Megjelenés helye	Advanced materials'95. Ed.:Y.Bande et al. Tsukuba
Megjelenés éve	1995
Oldal	161
Hivatkozó	Tougaard S.
Linkek	Hivatkozott Publikáció

**H50789** --> **P7684**
Megjelenés helye	^SCI Applied Surface Science
Megjelenés éve	1996
Oldal	1
Kötet	101
Hivatkozó	Tougaard S.
Linkek	Hivatkozott Publikáció

Összes Hivatkozása

Szerzői Táblázat

	Total	Headed by ATOMKI under name of the author	Part of the author	Part of the author & ATOMKI
Publications:	27	0	2.119	0
^SCIPublications:	10	0	0.767	0
Cited publications:	11	0	0.994	0
Non-locally cited publications:	11	0	0.994	0
Cited ^SCIpublications:	9	0	0.696	0
Non-locally cited ^SCIpublications:	9	0	0.696	0
^SCICited publications:	10	0	0.91	0
Non-locally ^SCIcited publications:	10	0	0.91	0
^SCICited ^SCIpublications:	8	0	0.613	0
Non-locally ^SCIcited ^SCIpublications:	8	0	0.613	0
Citations:	43	0	3.281	0
Non-local citations:	42	0	3.081	0
SCICitations:	43	0	3.281	0
Non-local ^SCIcitations:	34	0	2.604	0
Impact^~2012:	13.999	0	2.119	0
Averaged impact:	0.518	0	2.119	0
^SCIaveraged impact:	1.278	0	0.767	0
Citational effectivity:	3.909	0	0.994	0
Non-local citational effectivity:	3.818	0	0.994	0
SCIcitational effectivity:	3.4	0	0.91	0
Non-local ^SCIcitational effectivity:	3.4	0	0.91	0
Publications, n:	5.889	0	0	0
^SCIPublications, n:	6	0	0	0
Cited publications, n:	5.727	0	0	0
Non-locally cited publications, n:	5.727	0	0	0
Cited ^SCIpublications, n:	6	0	0	0
Non-locally cited ^SCIpublications, n:	6	0	0	0
^SCICited publications, n:	5.8	0	0	0
Non-locally ^SCIcited publications, n:	5.8	0	0	0
^SCICited ^SCIpublications, n:	6.125	0	0	0
Non-locally ^SCIcited ^SCIpublications, n:	6.125	0	0	0
z-index:	4	0	0	0

APHA Szerző - Tougaard S.⁴

P25609

Comparison between surface excitation parameter obtained from QUEELS and SESINIPAC.

P19387

Intrinsic and extrinsic excitations in deep core photoelectron spectra of solid Ge.

P18922

Test of dielectric-response model for energy and angular dependence of plasmon excitations in core-level photoemission.

P18768

Intrinsic and extrinsic losses in deep core photoelectron and Auger spectra of solid Ge and Si (Book of Abstracts of ECASIA 05, p. 226).

P18765

Test of dielectric response model for energy and angular dependence of plasmon excitations in core-level photoemission (Book of abstracts of ECASIA 05, p. 225).

P17476

Contribution of intrinsic and extrinsic excitations to KLL Auger spectra induced from Ge films.

P17108

Extrinsic and intrinsic excitations in Ge and Si photoelectron spectra (Abstracts of AVS50, http://www.avs.org).

P16988

Thickness of thin Co films determined by K-Auger spectral shapes analysis and RBS (Book of abstracts: p. 371).

P16718

Contribution of intrinsic and extrinsic excitations to KLL Auger spectra induced from Ge films (Abstr.: p. 149).

P16698

Experimental determination of electron inelastic scattering cross-sections in Si, Ge and III-V semiconductors.

H14237 --> P7684

H23763 --> P7684

H33901 --> P19387

H41634 --> P7684

H50789 --> P7684

Szerzői Táblázat

APHA Szerző - Tougaard S.4

P25609

Comparison between surface excitation parameter obtained from QUEELS and SESINIPAC.

P19387

Intrinsic and extrinsic excitations in deep core photoelectron spectra of solid Ge.

P18922

Test of dielectric-response model for energy and angular dependence of plasmon excitations in core-level photoemission.

P18768

Intrinsic and extrinsic losses in deep core photoelectron and Auger spectra of solid Ge and Si (Book of Abstracts of ECASIA 05, p. 226).

P18765

Test of dielectric response model for energy and angular dependence of plasmon excitations in core-level photoemission (Book of abstracts of ECASIA 05, p. 225).

P17476

Contribution of intrinsic and extrinsic excitations to KLL Auger spectra induced from Ge films.

P17108

Extrinsic and intrinsic excitations in Ge and Si photoelectron spectra (Abstracts of AVS50, http://www.avs.org).

P16988

Thickness of thin Co films determined by K-Auger spectral shapes analysis and RBS (Book of abstracts: p. 371).

P16718

Contribution of intrinsic and extrinsic excitations to KLL Auger spectra induced from Ge films (Abstr.: p. 149).

P16698

Experimental determination of electron inelastic scattering cross-sections in Si, Ge and III-V semiconductors.

H14237 --> P7684

H23763 --> P7684

H33901 --> P19387

H41634 --> P7684

H50789 --> P7684

Szerzői Táblázat

APHA Szerző - Tougaard S.⁴