APHA Szerző - Williams C. T.4


 An evaluation of the accuracy and precision of X-Ray microanalysis techniques using BCR-126A glass reference material.

Szerzők Gómez-Morilla I.,  Simon A.,  Simon R.,  Williams C. T.,  Kiss Á. Z.,  Grime G. W.
Megjelenés helye SCI Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 249 (2006) 897
Impakt faktor 0.9462006
Jelleg Scientific paper, proceedings
Témák Developm. of Instr. and Methods
Materials Science and Analytics
Linkek Hivatkozások (2)


 An evaluation of reference materials for PIXE and other X-ray microanalysis techniques (Abstr.: p. P-Mon-107, No. 360).

Szerzők Gomez-Morilla I.,  Simon A.,  Simon R.,  Williams C. T.,  Kiss Á. Z.,  Grime G. W.
Megjelenés helye 17th International Conference on Ion Beam Analysis. IBA 2005. Seville, Spain, 26 June - 1 July, 2005 0 (2005) 0
Jelleg Conf. abstract, poster, talk
Témák Materials Science and Analytics

Szerzői Táblázat

Total Headed by ATOMKI under name
of the author
Part of the author Part of the author & ATOMKI
Cited publications:100.0830
Non-locally cited publications:100.0830
Cited SCIpublications:100.0830
Non-locally cited SCIpublications:100.0830
SCICited publications:100.0830
Non-locally SCIcited publications:100.0830
SCICited SCIpublications:100.0830
Non-locally SCIcited SCIpublications:100.0830
Non-local citations:200.1670
Non-local SCIcitations:200.1670
Averaged impact:0.47300.1670
SCIaveraged impact:0.94600.0830
Citational effectivity:200.0830
Non-local citational effectivity:200.0830
SCIcitational effectivity:200.0830
Non-local SCIcitational effectivity:200.0830
Publications, n:5000
SCIPublications, n:5000
Cited publications, n:5000
Non-locally cited publications, n:5000
Cited SCIpublications, n:5000
Non-locally cited SCIpublications, n:5000
SCICited publications, n:5000
Non-locally SCIcited publications, n:5000
SCICited SCIpublications, n:5000
Non-locally SCIcited SCIpublications, n:5000