APHA Szerző - Laakso A.4

P12810

 Influence of surface topography on depth profiles obtained by Rutherford backscattering spectrometry.

Szerzők Slotte J.,  Laakso A.,  Ahlgren T.,  Rauhala E.,  Salonen R.,  Raisanen J.,  Simon A.,  Uzonyi I.,  Kiss Á. Z.,  Somorjai E.
Megjelenés helye SCI Journal of Applied Physics 87 (2000) 140
Impakt faktor 2.1802000
Jelleg Scientific paper, proceedings
Témák Materials Science and Analytics
Linkek Hivatkozások (11)

Szerzői Táblázat

Total Headed by ATOMKI under name
of the author
Part of the author Part of the author & ATOMKI
Publications:100.0250
SCIPublications:100.0250
Cited publications:100.0250
Non-locally cited publications:100.0250
Cited SCIpublications:100.0250
Non-locally cited SCIpublications:100.0250
SCICited publications:100.0250
Non-locally SCIcited publications:100.0250
SCICited SCIpublications:100.0250
Non-locally SCIcited SCIpublications:100.0250
Citations:1100.2750
Non-local citations:1000.250
SCICitations:1100.2750
Non-local SCIcitations:800.20
Impact~2000:2.1800.0250
Averaged impact:2.1800.0250
SCIaveraged impact:2.1800.0250
Citational effectivity:1100.0250
Non-local citational effectivity:1000.0250
SCIcitational effectivity:900.0250
Non-local SCIcitational effectivity:800.0250
Publications, n:9000
SCIPublications, n:9000
Cited publications, n:9000
Non-locally cited publications, n:9000
Cited SCIpublications, n:9000
Non-locally cited SCIpublications, n:9000
SCICited publications, n:9000
Non-locally SCIcited publications, n:9000
SCICited SCIpublications, n:9000
Non-locally SCIcited SCIpublications, n:9000
z-index:0000