APHA Szerző - Fried M.4

P21945

 Investigation of an ion-milled Si/Cr multilayer using micro-RBS, ellipsometry and AES depth profiling techniques.

Authors Simon A.,  Sulyok A.,  Novák M.,  Juhász G.,  Lohner T.,  Fried M.,  Barna A.,  Huszánk R.,  Menyhárd M.
Megjelenés helye SCI Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 267 (2009) 2212
Impact factor 1.1562009
Character Scientific paper, proceedings
Topics Materials Science and Analytics
Linkek DOI Hivatkozások (2)

Szerzői Táblázat

Total Headed by ATOMKI under name
of the author
Part of the author Part of the author & ATOMKI
Publications:100.0370
SCIPublications:100.0370
Cited publications:100.0370
Non-locally cited publications:100.0370
Cited SCIpublications:100.0370
Non-locally cited SCIpublications:100.0370
SCICited publications:100.0370
Non-locally SCIcited publications:100.0370
SCICited SCIpublications:100.0370
Non-locally SCIcited SCIpublications:100.0370
Citations:200.0740
Non-local citations:100.0370
SCICitations:200.0740
Non-local SCIcitations:100.0370
Impact~2009:1.15600.0370
Averaged impact:1.15600.0370
SCIaveraged impact:1.15600.0370
Citational effectivity:200.0370
Non-local citational effectivity:100.0370
SCIcitational effectivity:200.0370
Non-local SCIcitational effectivity:100.0370
Publications, n:8000
SCIPublications, n:8000
Cited publications, n:8000
Non-locally cited publications, n:8000
Cited SCIpublications, n:8000
Non-locally cited SCIpublications, n:8000
SCICited publications, n:8000
Non-locally SCIcited publications, n:8000
SCICited SCIpublications, n:8000
Non-locally SCIcited SCIpublications, n:8000
z-index:0000