APHA Szerző - Sellin P. J.4

P20432

 Charge transport in polycrystalline and single crystal synthetic diamond using ion beam induced charge imaging.

Szerzők Sellin P. J.,  Lohstroh A.,  Davies A. W.,  Galbiati A.,  Parkin J.,  Wang S. G.,  Simon A.
Megjelenés helye SCI Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 260 (2007) 293
Impakt faktor 0.9972007
Jelleg Scientific paper, proceedings
Témák Materials Science and Analytics
Linkek Hivatkozások (2)

P19070

 Ion beam induced charge microscopy imaging of CVD diamond.

Szerzők Simon A.,  Sellin P. J.,  Lohstroh A.,  Jeynes C.
Megjelenés helye Design and Nature 2004. 2nd International Conference: Comparing Design in Nature with Science and Engineering. Rhodes, Greece, 28-30 June, 2004 0 (2004) 0
Jelleg Conf. abstract, poster, talk
Témák Materials Science and Analytics

P18722

 The role of defects on CdTe detector performance.

Szerzők Sellin P. J.,  Özsan M. E.,  Hoxley D.,  Lohstroh A.,  Siffert P.,  Sowinska M.,  Simon A.
Megjelenés helye 2003 IEEE Nuclear Science Symposium. Nuclear Science Symposium Medical Imaging Conference. Portland, Oregano, USA. Proceedings. Guest editor: Metzler, S.D. IEEE 0 (2005) 3306
Jelleg Scientific paper, proceedings
Témák Developm. of Instr. and Methods
Materials Science and Analytics

P18721

 The role of defects on CdTe detector performance.

Szerzők Sellin P. J.,  Özsan M. E.,  Hoxley D.,  Lohstroh A.,  Siffert P.,  Sowinska M.,  Simon A.
Megjelenés helye 2003 IEEE Nuclear Science Symposium, Nuclear Science Symposium Medical Imaging Conference. Portland, Oregon, USA, 19.25 Oct., 2003 0 (2005) 0
Jelleg Conf. abstract, poster, talk
Témák Developm. of Instr. and Methods
Materials Science and Analytics

P17979

 Ion beam induced charge imaging of epitaxial GaN detectors.

Szerzők Sellin P. J.,  Hoxley D.,  Lohstroh A.,  Simon A.,  Cunningham W.,  Rahman M.,  Vaitkus J.,  Gaubas E.
Megjelenés helye SCI Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 531 (2004) 82
Impakt faktor 1.3492004
Jelleg Scientific paper, proceedings
Témák Materials Science and Analytics
Linkek Hivatkozások (2)

P17978

 Ion beam induced charge imaging of epitaxial GaN detectors.

Szerzők Sellin P. J.,  Hoxley D.,  Lohstroh A.,  Simon A.,  Cunningham W.,  Rahman M.,  Vaitkus J.,  Gaubas E.
Megjelenés helye 5th International Workshop on Radiation Imaging Detectors. Riga, Latvia, 21 Sept., 2004 0 (2004) 0
Jelleg Conf. abstract, poster, talk
Témák Materials Science and Analytics

P17732

 Mobility and lifetime mapping in wide bandgap semiconductors using digital IBIC (Abstr.: p. 13).

Szerzők Sellin P. J.,  Lohstroh A.,  Simon A.
Megjelenés helye 9th International Conference on Nuclear Microprobe Technology and Applications. Cavtat, Dubrovnik, Croatia, 13-17 Sept., 2004 0 (2004) 0
Jelleg Conf. abstract, poster, talk
Témák Developm. of Instr. and Methods
Materials Science and Analytics

P17623

 The influence of tellurium precipitates on mobility in CdTe (Abstr.: p. 31).

Szerzők Davies A. W.,  Sellin P. J.,  Lohstroh A.,  Özsan M. E.,  Simon A.
Megjelenés helye 6th International Workshop on Radiation Imaging Detectors. Glasgow Skocia, 25-29 July, 2004 0 (2004) 0
Jelleg Conf. abstract, poster, talk
Témák Materials Science and Analytics

P17473

 The new Surrey ion beam analysis facility.

Szerzők Simon A.,  Jeynes C.,  Webb R.,  Finnis R.,  Tabatabaian Z.,  Sellin P. J.,  Breese M.,  Fellows M.,  van der Broek R.,  Gwilliam R.
Megjelenés helye SCI Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 219 (2004) 405
Impakt faktor 0.9972004
Jelleg Scientific paper, proceedings
Témák Materials Science and Analytics
Linkek Hivatkozások (9)

P17405

 Digital IBIC - new spectroscopic modalities for ion-beam-induced charge imaging.

Szerzők Sellin P. J.,  Lohstroh A.,  Simon A.,  Breese M. B. H.
Megjelenés helye SCI Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 521 (2004) 600
Impakt faktor 1.3492004
Jelleg Scientific paper, proceedings
Témák Developm. of Instr. and Methods
Materials Science and Analytics
Linkek Hivatkozások (3)
Összes Publikációja

Szerzői Táblázat

Total Headed by ATOMKI under name
of the author
Part of the author Part of the author & ATOMKI
Publications:1402.9120
SCIPublications:500.9510
Cited publications:500.9510
Non-locally cited publications:500.9510
Cited SCIpublications:500.9510
Non-locally cited SCIpublications:500.9510
SCICited publications:400.6180
Non-locally SCIcited publications:400.6180
SCICited SCIpublications:400.6180
Non-locally SCIcited SCIpublications:400.6180
Citations:1802.8520
Non-local citations:1802.8520
SCICitations:1802.8520
Non-local SCIcitations:1301.7110
Impact~2007:6.74102.9120
Averaged impact:0.48202.9120
SCIaveraged impact:1.34800.9510
Citational effectivity:3.600.9510
Non-local citational effectivity:3.600.9510
SCIcitational effectivity:3.2500.6180
Non-local SCIcitational effectivity:3.2500.6180
Publications, n:4.857000
SCIPublications, n:5.4000
Cited publications, n:5.4000
Non-locally cited publications, n:5.4000
Cited SCIpublications, n:5.4000
Non-locally cited SCIpublications, n:5.4000
SCICited publications, n:6.25000
Non-locally SCIcited publications, n:6.25000
SCICited SCIpublications, n:6.25000
Non-locally SCIcited SCIpublications, n:6.25000
z-index:2000