Atommagkutató Intézet
MTA Kiváló Kutatóhely

Elektronmikroszkópos vizsgálatok

Kompetencia terület Analysis of materials and surfaces
Módszer SEM, TEM, EDX
Kapcsolattartó
Szakmai leírás

Scanning electron microscope (SEM) can be used to study the wide range of samples, such as metals, semiconductors, ceramics, samples related to biological and medical applications. In addition to basic scientific research,  the application of microscopes can be expanded also to the quality control at industrial site. Morphological and composition analysis of different type of samples possible in our laboratories with JEOL IT500HR/LV and ThermoScientific Scios2 DualBeam microscopes.

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