PIXEKLM program package is suitable for the total processing of X-ray spectra obtained by the PIXE method; that is to determine the concentrations of the elements in thick (infinite and finite thickness) and thin samples.

The program package consists of two essential parts. KLM program calculates effective X-ray production cross sections and effective relative intensities, considering all of the experimental conditions. PFIT program processes the spectra and determines the concentrations of elements in the sample on the basis of K, L or M X-ray lines, using the results of KLM. In addition to the matrix effects the secondary excitations, pile-up peaks and dead time correction are taken into consideration, too.

The database of the program package is based upon the compilation of theoretical results. It makes possible the determination of elemental concentrations in the Z = 5-92 range of atomic numbers. KLM program can process K lines Z = 5-56, L lines in the Z = 17-92, and M lines in the Z = 31-92 ranges of atomic numbers. The concentration calculation of an element in overlapping ranges can be made on the basis of the main line of either line groups separately, or on the basis of one of the main lines of all line groups together.

This program package can be considered as an improvement of PIXASE [L. Zolnai 88], [Gy. Szabó 89] and an expanded version of the previous PIXYKLM [Gy.Szabó 93] program package.

Program package was developed under DOS, but WINDOWS 95 …XP versions of KLM and PFIT are also existent.

Content of the PIXEKLM program manual

I.                 Abstract

II.                    KLM program

II.1.                    Introduction

II.2.                    Physical principles and the effective X-ray production cross sections

II.2.1.                 Thin samples

II.2.2.                 Thick samples

II.3.                    Structure of database and files including data

II.3.1.                 K X-ray data

II.3.2.                 L X-ray data

II.3.3.                 M X-ray data

II.3.4.                 Mass attenuation and photo-absorption coefficients

II.3.5.                 Photoionization cross-sections

II.3.6.                 Natural widths of X-ray lines

II.3.7.                 Data of stopping power

II.3.8.                 Data of Gauss integration

II.4.                    Computing methods

II.4.1.                 Computing of ionization cross sections

II.4.2.                 Calculation of effective X-ray production cross sections

II.4.3.                 The response probability of the Si( Li) detector

II.5.                    Description of the result file

II.6.                    Description of the library file

II.7.                    KLM program instructions

II.7.1.                 Running of the program

II.7.2.                 Command file

II.7.3.                 Description of DET.SIL file

II.7.4.                 Remarks on the use of KLM program

III.                     PFIT program

III.1.                  Introduction

III.2.                  Modelling of the spectrum

III.2.1.               Description of the peak shape

III.2.2.               The shape of the function describing the background and problems of background fitting

III.2.3.               Description of the pile-up function

III.2.4.               Modelling of the ” Escape” process

III.3.                  Fitting of spectra

III.4.                  Dead time correction

III.5.                  Determination of the solid angle of the detector

III.6.                  Calculation of the concentrations of the constituents in the sample

III.7.                  Determination of elemental constituents of thick samples

III.8.                  The possible format of the spectrum files

III.9.                  Description of result files

III.10.                The use of the PFIT program

III.10.1.             Running of the program

III.10.2.             Command file

III.10.3.             Blank file

III.10.4.             Remarks on the figure shown on the screen

III.10.5.             Remarks on PFIT program

VI.                     General remarks

V.                       Utility routines to use PIXEKLM system

V.1.                    STOP program

V.2.                    PFSIG program

V.3.                    RM program

VI.                     Application of PIXEKLM program on Windows operating system

VII.                    Necessary hardware configuration of the program system

VIII.                   References